Compaction of ATPG-generated test sequences for sequential circuits

Volumn , Issue , 1988, Pages 382-385

  Roy, Rabindra K ^a   Niermann, Tom M ^a   Patel, Janak H ^a   Abraham, Jacob A ^a   Saleh, Resve A ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING LANGUAGES; INTEGRATED CIRCUIT TESTING;

AUTOMATIC TEST PATERN GENERATORS; COMPACTION; SEQUENTIAL CIRCUITS; TEST SEQUENCES;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0024177231     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)