SCOPUS 정보 검색 플랫폼

Volumn 15, Issue 1-4, 1988, Pages 331-337

Quality control & inspection. Knowledge-based quality control system

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE--EXPERT SYSTEMS; DATABASE SYSTEMS; INSPECTION--COMPUTER APPLICATIONS;

CONTROL CHART; DECISION MATRIX; PROCESS CAPABILITY INDEX;

QUALITY CONTROL;

EID: 0024177124 PISSN: 03608352 EISSN: None Source Type: Journal
DOI: 10.1016/0360-8352(88)90107-6 Document Type: Article

Times cited : (21)

References (8)

1
- 0003458464
- John Wiley & Sons, New York
- (1986) Statistical Process Control
- Oakland¹

2
- 0003926184
- Addison-Wesley Publishing
- (1986) A Guide to Expert Systems
- Waterman¹

3
- 0004057724
- Marcel Dekker, Inc, New York
- (1976) Statistical Quality Control Methods
- Burr¹

4
- 0004271456
- 2nd edition, Prentice-Hall, New Jersey
- (1986) Quality Control
- Besterfield¹

6
- 84909731730
- Nagy, T., Gault, D., and Nagy, M., Building Your First Expert System

7
- 84909731729
- Thrid Edition, University of Central Florida
- (1987) IEMS Internal Report
- Cutchins¹

8
- 84909713402
- and others, Institute of Industrial Engineers, Norcorss, GA
- (1987) IIE Microsoftware: Statistical Quality Control
- Whitehouse¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.