Post-irradiation effects in CMOS integrated circuits

IEEE Transactions on Nuclear Science

Volumn 35, Issue 6, 1988, Pages 1662-1666

  Zietlow, T C ^a   Barnes, C E ^a   Morse, T C ^a   Grusynski, J S ^a   Nakamura, K ^a   Amram, A ^a   Wilson, K T ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; SEMICONDUCTOR DEVICES, MOS;

CMOS INTEGRATED CIRCUITS; RADIATION HARDNESS; SILICON-ON-INSULATOR TECHNOLOGY;

INTEGRATED CIRCUITS;

EID: 0024175361     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25517     Document Type: Article

References (13)

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