Comparison of threshold damage processes in track field oxide protection devices following square pulse and human body model injection

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1988, Pages 129-136

  Bridgwood, Michael A ^a   Fu, Yujun ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; REFLECTOMETERS--APPLICATIONS;

ESD PROTECTION CIRCUITS; HUMAN BODY MODEL INJECTION; SQUARE PULSE TESTING; TEMPERATURE STRESS TESTS; THICK FIELD OXIDE PROTECTION DEVICES; THRESHOLD DAMAGE PROCESSES;

ELECTRIC DISCHARGES;

EID: 0024175137     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)