Maximum Likelihood Analysis of Component Reliability Using Masked System Life-Test Data

IEEE Transactions on Reliability

Volumn 37, Issue 5, 1988, Pages 550-555

  Usher, John S ^a   Hodgson, Thom J ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Competing risk model; imum likelihood estimator; Masked data; Max

Indexed keywords

COMPUTER SIMULATION; FAILURE ANALYSIS; MATHEMATICAL STATISTICS; SYSTEMS ANALYSIS;

COMPETING RISK MODEL; COMPONENT RELIABILITY ANALYSIS; MASKED DATA; MAXIMUM LIKELIHOOD ANALYSIS;

RELIABILITY THEORY;

EID: 0024174596     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/24.9880     Document Type: Article

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