Dose and energy dependence of interface trap formation in cobalt-60 and X-ray environments

IEEE Transactions on Nuclear Science

Volumn 35, Issue 6, 1988, Pages 1260-1264

  Benedetto, J M ^a   Boesch, H E ^a   McLean, F B ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT AND ALLOYS; ISOTOPES; PHOTONS; SEMICONDUCTOR DEVICES, MOSFET; X-RAYS;

ENERGY DEPENDENCE; INTERFACE TRAPS;

TRANSISTORS;

EID: 0024172673     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25449     Document Type: Article

References (19)

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