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0023594015
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Experimental and Theoretical Study of Alpha Particle Induced Charge Transport in GaAs FETs
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W. T. Anderson, A. R. Knudson, F. A. Buot, H. L. Grubin, J. P. Kreskovsky, A. B. Campbell, Experimental and Theoretical Study of Alpha Particle Induced Charge Transport in GaAs FETs, IEEE Trans. Nuc. Sci., NS-34, No. 6, (1987) pp. 1326–1331.
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0022243469
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Comparison of 2D Memory SEU Simulation with Experiment
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J. S. Fu, H. T. Weaver, R. Koga,W. A. Kolasinski, Comparison of 2D Memory SEU Simulation with Experiment, IEEE Trans. Nuc. Sci., NS-32, No. 6, (1985) pp. 4115–4150.
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3
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0023589460
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Processing Enhanced SEU Tolerance in High Density SRAMs
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J. S. Fu, K. H. Lee, R. Koga, W. A. Kolasinski, H. T. Weaver, J.S. Browning, Processing Enhanced SEU Tolerance in High Density SRAMs, IEEE Trans Nuc. Sci. NS-34, No. 6, (1987), pp 1322–1326.
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Weaver, H.T.5
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0022216712
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Simulation of Charge Collection in a Multi Layer Device
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J. P. Kreskovsky, H. L. Grubin, Simulation of Charge Collection in a Multi Layer Device, IEEE Trans. Nuc. Sci., NS-32, No. 6, (1985), pp 4140–4145.
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Kreskovsky, J.P.1
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0042875279
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Stanford Electronics Laboratory, Stanford University
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Single Event Upset in SOS Integrated Circuits
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Dec
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J. G. Rollins, W. A. Kolasinski, J. Choma Jr., R. Koga, Single Event Upset in SOS Integrated Circuits, IEEE Trans. Nuc. Sci., NS-34, No. 6, Dec, (1987), pp 1713–1717.
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Rollins, J.G.1
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0024055720
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Mixed Mode PISCES-SPICE Coupled Circuit and Device Solver
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J. G. Rollins, J. Choma Jr., Mixed Mode PISCES-SPICE Coupled Circuit and Device Solver, IEEE Trans. Comp. Aided Des., August, 1988.
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Rollins, J.G.1
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0022868813
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Numerical Simulation of SEU Induced Latchup
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J. G. Rollins, W. A. Kolasinski, D. C. Marvin, R. Koga Numerical Simulation of SEU Induced Latchup, IEEE Trans. Nuc. Sci., NS-33, No. 6, Dec, (1986), pp 1565–1570.
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Rollins, J.G.1
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0022188818
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Ion Track Shunt Effects in Multi-Junction Structures
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J. R. Hauser, S. E. Diehl-Nagel, A. R. Knudson, A. B. Campbell, W. J. Stapor, P. Shapiro, Ion Track Shunt Effects in Multi-Junction Structures, IEEE Trans. Nuc. Sci., NS-32, No. 6, (1985) pp 4115–4122.
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13
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0021615546
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Heavy Ion Induced Single Event Upsets of Modern Microcircuits
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K. Koga, W. A. Kolasinski, Heavy Ion Induced Single Event Upsets of Modern Microcircuits, IEEE Trans. Nuc. Sci., NS-31, No. 6, (1984) pp. 1190–1196.
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Koga, K.1
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