메뉴 건너뛰기




Volumn 35, Issue 6, 1988, Pages 1608-1612

Cost-Effective Numerical Simulation of SEU

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COST ACCOUNTING; MATHEMATICAL TECHNIQUES--NUMERICAL ANALYSIS;

EID: 0024170571     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25506     Document Type: Article
Times cited : (19)

References (13)
  • 2
    • 0022243469 scopus 로고
    • Comparison of 2D Memory SEU Simulation with Experiment
    • J. S. Fu, H. T. Weaver, R. Koga,W. A. Kolasinski, Comparison of 2D Memory SEU Simulation with Experiment, IEEE Trans. Nuc. Sci., NS-32, No. 6, (1985) pp. 4115–4150.
    • (1985) IEEE Trans. Nuc. Sci. , vol.NS-32 , Issue.6 , pp. 4115-4150
    • Fu, J.S.1    Weaver, H.T.2    Koga, R.3    Kolasinski, W.A.4
  • 4
    • 0022216712 scopus 로고
    • Simulation of Charge Collection in a Multi Layer Device
    • J. P. Kreskovsky, H. L. Grubin, Simulation of Charge Collection in a Multi Layer Device, IEEE Trans. Nuc. Sci., NS-32, No. 6, (1985), pp 4140–4145.
    • (1985) IEEE Trans. Nuc. Sci. , vol.NS-32 , Issue.6 , pp. 4140-4145
    • Kreskovsky, J.P.1    Grubin, H.L.2
  • 6
    • 84939031207 scopus 로고
    • Electronics Research Laboratory, University of California, Berkeley
    • L. W. Nagel, SPICE2 Users Guide, Electronics Research Laboratory, University of California, Berkeley, (1986).
    • (1986) SPICE2 Users Guide
    • Nagel, L.W.1
  • 8
    • 84886549239 scopus 로고
    • Single Event Upset in SOS Integrated Circuits
    • Dec
    • J. G. Rollins, W. A. Kolasinski, J. Choma Jr., R. Koga, Single Event Upset in SOS Integrated Circuits, IEEE Trans. Nuc. Sci., NS-34, No. 6, Dec, (1987), pp 1713–1717.
    • (1987) IEEE Trans. Nuc. Sci. , vol.NS-34 , Issue.6 , pp. 1713-1717
    • Rollins, J.G.1    Kolasinski, W.A.2    Choma, J.3    Koga, R.4
  • 9
    • 0024055720 scopus 로고
    • Mixed Mode PISCES-SPICE Coupled Circuit and Device Solver
    • August
    • J. G. Rollins, J. Choma Jr., Mixed Mode PISCES-SPICE Coupled Circuit and Device Solver, IEEE Trans. Comp. Aided Des., August, 1988.
    • (1988) IEEE Trans. Comp. Aided Des.
    • Rollins, J.G.1    Choma, J.2
  • 13
    • 0021615546 scopus 로고
    • Heavy Ion Induced Single Event Upsets of Modern Microcircuits
    • K. Koga, W. A. Kolasinski, Heavy Ion Induced Single Event Upsets of Modern Microcircuits, IEEE Trans. Nuc. Sci., NS-31, No. 6, (1984) pp. 1190–1196.
    • (1984) IEEE Trans. Nuc. Sci. , vol.NS-31 , Issue.6 , pp. 1190-1196
    • Koga, K.1    Kolasinski, W.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.