Circuit aging simulator (CAS)

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1988, Pages 134-137

  Lee, Peter M ^a   Kuo, Mary M ^a   Seki, Koichi ^a   Lo, P K ^a   Hu, C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; SEMICONDUCTOR DEVICES, MOS;

CIRCUIT AGING SIMULATOR; HOT-ELECTRON DEGRADATION; MOS CIRCUIT; SPICE CODE; UNIX;

ELECTRONIC CIRCUITS;

EID: 0024170237     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)