Total dose radiation hardness of MOS devices in hermetic ceramic packages

IEEE Transactions on Nuclear Science

Volumn 35, Issue 6, 1988, Pages 1492-1496

  Kohler, Ross A ^a   Kushner, Richard A ^a   Lee, Kuo Hua ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTRONICS PACKAGING; HYDROGEN--DIFFUSION;

HERMETIC CERAMIC PACKAGES; IONIZING RADIATION; RADIATION HARDNESS;

SEMICONDUCTOR DEVICES, MOS;

EID: 0024169724     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25486     Document Type: Article

References (14)

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