Comparison of threshold transient upset levels induced by flash X-rays and pulsed lasers

IEEE Transactions on Nuclear Science

Volumn 35, Issue 6, 1988, Pages 1512-1516

  Raburn, W D ^a   Buchner, S P ^b   Kang, K ^b   Singh, R ^b   Sayers, S ^b  

^a UNIVERSITY OF SOUTH ALABAMA   (United States)

^b LOCKHEED MARTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; LASER PULSES; X-RAYS;

PACKAGED PARTS; SEMICONDUCTOR WAFERS;

INTEGRATED CIRCUITS;

EID: 0024168207     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25489     Document Type: Article

References (12)

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