Experimental soft-error immune 64-kb 3ns ECL bipolar RAM

Volumn , Issue , 1988, Pages 26-27

  Yamaguchi, Kunihiko ^a   Nanbu, Hiroaki ^a   Kanetani, Kazuo ^a   Homma, Noriyuki ^a   Nakamura, Tohru ^a   Ohhata, Kenichi ^a   Uchida, Akihisa ^a   Ogiue, Katsumi ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS; LOGIC CIRCUITS, EMITTER COUPLED; SEMICONDUCTING SILICON;

DISCHARGE CIRCUITS; RANDOM ACCESS MEMORY (RAM); SOFT-ERROR IMMUNE MEMORY; UPWARD TRANSISTOR DECODER;

DATA STORAGE, DIGITAL;

EID: 0024143547     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)