Growth and current characteristics of stable protrusions on tungsten field ion emitters

Ultramicroscopy

Volumn 26, Issue 3, 1988, Pages 301-311

  Jousten, K ^a   Bohringer K ^a   Borret R ^a   Kalbitzer, S ^a  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; TUNGSTEN AND ALLOYS;

FIELD ION EMITTERS; PROTRUSIONS;

MICROSCOPES, ION;

EID: 0024141010     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(88)90229-X     Document Type: Article

References (25)

1. Beam current stability from localized emission sites in a field ion source
2. Summary Abstract: Physical aspects of gaseous field ion beam current stability
3. Surface self-diffusion by ion impact
4. In situ morphological control of stm probes by helium cathode bombardment
5. Development of a high-brightness gas field-ionization source
6. Point source for ions and electrons