The osmium-silicon phase diagram

Journal of The Less-Common Metals

Volumn 144, Issue 2, 1988, Pages 341-350

  Schellenberg, L ^a   Braun, H F ^a   Muller, J ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL THERMAL ANALYSIS; ELECTRIC CONDUCTIVITY; METALLOGRAPHY; SEMICONDUCTOR MATERIALS; X-RAYS--DIFFRACTION;

METASTABLE PHASE; MICROPROBE ANALYSIS;

OSMIUM SILICON ALLOYS;

EID: 0024138158     PISSN: 00225088     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-5088(88)90148-8     Document Type: Article

References (13)

1. The Crystal Structures of the Monosilicides of Osmium, Iridium and Ruthenium
2. FINAX: a computer program for correcting diffraction angles, refining cell parameters and calculating powder patterns
3. Diffusionless phase transformations of Ru2Si3, Ru2Ge3 and Ru2Sn3 II: electrical and magnetic properties