Random testability analysis: Comparing and evaluating existing approaches

Volumn , Issue , 1988, Pages 70-73

  Camurati, P ^a   Prinetto, P ^a   Reorda, M Sonza ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING -- ALGORITHMS; INTEGRATED CIRCUIT TESTING -- AUTOMATIC TESTING;

COP ALGORITHM; CUTTING ALGORITHM; RANDOM TESTABILITY ANALYSIS; STAFAN ALGORITHM; WEIGHTED AVERAGING ALGORITHM;

INTEGRATED CIRCUITS, VLSI;

EID: 0024136037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)