Pattern-independent current estimation for reliability analysis of CMOS circuits.

Proceedings - Design Automation Conference

Volumn , Issue , 1988, Pages 294-299

  Burch, Richard ^a   Najm, Farid ^a   Yang, Ping ^a   Hocevar, Dale ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS -- ANALYSIS; SEMICONDUCTOR DEVICES, MOS;

CMOS CIRCUITS; CURRENT WAVEFORMS; ELECTROMIGRATION; POWER CONSUMPTION; VOLTAGE DROP;

INTEGRATED CIRCUITS;

EID: 0024133782     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)