X-ray microanalysis of a hafnium carbide film oxidized at high temperature

Surface and Coatings Technology

Volumn 36, Issue 1-2, 1988, Pages 111-115

  Bargeron, C B ^a   Benson, R C ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROANALYSIS; SURFACES; X-RAY ANALYSIS;

HAFNIUM CARBIDE;

HAFNIUM COMPOUNDS;

EID: 0024133205     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/0257-8972(88)90140-5     Document Type: Article

References (5)