Power MOSFET failure revisited.

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn , Issue , 1988, Pages 681-688

  Blackburn, David L ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN -- THERMAL EFFECTS; ENERGY DISSIPATION;

AVALANCHE BREAKDOWN; CRITICAL CURRENT; POWER MOSFET;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0024130885     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)