CONTEST: A concurrent test generator for sequential circuits.

Proceedings - Design Automation Conference

Volumn , Issue , 1988, Pages 84-89

  Agrawal, Vishwani D ^a   Cheng, Kwang Ting ^a   Agrawal, Prathima ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS, SEQUENTIAL;

ASYNCHRONOUS SEQUENTIAL CIRCUITS; CONCURRENT FAULT SIMULATOR; COST FUNCTION; TEST GENERATOR; TEST VECTOR;

SWITCHING THEORY;

EID: 0024127241     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)