Design for testability for mixed analog/digital ASICs.

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1988, Pages

  Fasang, Patrick P ^a   Mullins, Daryl ^a   Wong, Thomas ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, DIGITAL -- TESTING;

ANALOG TEST TABLES; ASICS; MIXED ANALOG-DIGITAL CIRCUITS; TESTABILITY; TESTABLE CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0024126098     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)