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Volumn 37, Issue 4, 1988, Pages 591-595

Measuring and Fitting the MOS Transistor at High Frequencies

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS--DESIGN; MATHEMATICAL TRANSFORMATIONS; SEMICONDUCTOR DEVICES, MOS;

EID: 0024125848     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.9820     Document Type: Article
Times cited : (2)

References (10)
  • 1
    • 0020834178 scopus 로고
    • On the small-signal behaviour of the MOS transistor in quasistatic operation
    • C. Turchetti, G. Masetti, and Y. Tsividis, “On the small-signal behaviour of the MOS transistor in quasistatic operation,” Solid-State Electron., vol. 26, no. 10, pp. 941–949. 1983.
    • (1983) Solid-State Electron , vol.26 , Issue.10 , pp. 941-949
    • Turchetti, C.1    Masetti, G.2    Tsividis, Y.3
  • 2
    • 0022152815 scopus 로고
    • A small signal dc-to-high-frequency nonquasistatic model for the four-terminal MOSFET valid in all regions of operations
    • Nov.
    • M. Bagheri and Y. Tsividis, “A small signal dc-to-high-frequency nonquasistatic model for the four-terminal MOSFET valid in all regions of operations,” IEEE Trans. Electron Devices, vol. ED-32, pp. 2383–2391, Nov. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 2383-2391
    • Bagheri, M.1    Tsividis, Y.2
  • 3
    • 0018027059 scopus 로고
    • A change-oriented model for MOS transistor capacitances
    • Oct.
    • D. E. Ward and R. W. Dutton, “A change-oriented model for MOS transistor capacitances,” IEEE J. Solid-State Circuits, vol. SC-13, pp. 703–707, Oct. 1978.
    • (1978) IEEE J. Solid-State Circuits , vol.SC-13 , pp. 703-707
    • Ward, D.E.1    Dutton, R.W.2
  • 4
    • 3343022641 scopus 로고
    • Modeling of the MOS transistor for high frequency analog design
    • Ph.D. dissertation, Belgium, Katholieke Univ. Leuven
    • P. Vandeloo, “Modeling of the MOS transistor for high frequency analog design,” Ph.D. dissertation, Belgium, Katholieke Univ. Leuven, 1987.
    • (1987)
    • Vandeloo, P.1
  • 5
    • 0021197310 scopus 로고
    • Problems in precision modeling of the MOS transistor for analog applications
    • Jan.
    • Y. Tsividis and G. Masetti, “Problems in precision modeling of the MOS transistor for analog applications,” IEEE Trans. Computer-Aided Design, vol. CAD-3, pp. 72–79, Jan. 1984.
    • (1984) IEEE Trans. Computer-Aided Design , vol.CAD-3 , pp. 72-79
    • Tsividis, Y.1    Masetti, G.2
  • 6
    • 0021787638 scopus 로고
    • A direct measurement technique for small geometry MOS transistor capacitances
    • Jan.
    • K. C. K. Weng and P. Yang, “A direct measurement technique for small geometry MOS transistor capacitances,” IEEE Electron Device Lett., vol. EDL-6, pp. 40–42, Jan. 1985.
    • (1985) IEEE Electron Device Lett , vol.EDL-6 , pp. 40-42
    • Weng, K.C.K.1    Yang, P.2
  • 8
    • 0022205592 scopus 로고
    • A simplified error model for accurate measurement of high-frequency transistor S parameters
    • Dec.
    • M. C. He, “A simplified error model for accurate measurement of high-frequency transistor S parameters,” IEEE Trans. Instrum. Meas., vol. IM-34, pp. 616–619, Dec. 1985.
    • (1985) IEEE Trans. Instrum. Meas , vol.IM-34 , pp. 616-619
    • He, M.C.1
  • 9
    • 0015604377 scopus 로고
    • Calibration of microwave network analyzer for computer corrected S parameter measurements
    • Mar.
    • E. F. Da Silva and M. K. McPhun, “Calibration of microwave network analyzer for computer corrected S parameter measurements,” Electron. Lett., vol. 9, no. 6, pp. 126–128, Mar. 1973.
    • (1973) Electron. Lett , vol.9 , Issue.6 , pp. 126-128
    • Da Silva, E.F.1    McPhun, M.K.2
  • 10
    • 0022028089 scopus 로고
    • Measurement of operational amplifier characteristics in the frequency domain
    • Mar.
    • W. Sansen, M. Steyaert, and P. Vandeloo, “Measurement of operational amplifier characteristics in the frequency domain,” IEEE Trans. Instrum. Meas., vol. IM-34, pp. 59–64, Mar. 85.
    • (1985) IEEE Trans. Instrum. Meas , vol.IM-34 , pp. 59-64
    • Sansen, W.1    Steyaert, M.2    Vandeloo, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.