Algorithmic branch and bound method for PLA test pattern generation

Digest of Papers - International Test Conference

Volumn , Issue , 1988, Pages 784-795

  Robinson, Markus ^a   Rajski, Janusz ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; INTEGRATED CIRCUIT TESTING;

BRANCH AND BOUND METHOD; PROGRAMMABLE LOGIC-ARRAY; TEST PATTERN GENERATION;

LOGIC CIRCUITS;

EID: 0024123229     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)