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Volumn , Issue , 1988, Pages 61-64
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Thermo-reliability relationships of GaAs ICS
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Author keywords
[No Author keywords available]
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Indexed keywords
INFRARED DETECTORS;
SEMICONDUCTING GALLIUM ARSENIDE;
TEMPERATURE MEASUREMENT;
THERMAL CONDUCTIVITY;
ACTIVATION ENERGIES;
LIFETIMES;
INTEGRATED CIRCUITS;
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EID: 0024123009
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (3)
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