Stuck-open and transition fault testing in CMOS complex gates

Digest of Papers - International Test Conference

Volumn , Issue , 1988, Pages 688-694

  Cox, Henry ^a   Rajski, Janusz ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; LOGIC DEVICES--GATES; SEMICONDUCTOR DEVICES, MOS;

CMOS TECHNOLOGY; GEMINI LOGIC SYSTEM; STUCK-OPEN FAULTS; TRANSITION FAULT TESTING;

LOGIC CIRCUITS;

EID: 0024122316     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)