Hierarchical test generation using precomputed tests for modules

Digest of Papers - International Test Conference

Volumn , Issue , 1988, Pages 221-229

  Murray, Brian T ^a   Hayes, John P ^a  

^a GM Research Lab   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; SIGNAL PROCESSING;

CIRCUIT MODULES; HIERARCHICAL TEST GENERATION; TEST VECTORS;

ELECTRONIC CIRCUITS;

EID: 0024122312     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)