Suppression of Hot-Carrier Effects in Submicrometer CMOS Technology

IEEE Transactions on Electron Devices

Volumn 35, Issue 12, 1988, Pages 2210-2220

  Chen, Min Liang ^a   Leung, Chung Wai ^a   Cochran, W T ^a   Jüngling, Werner ^a   Dziuba, Charles ^a   Yang, Tungsheng ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

CMOS INTEGRATED CIRCUITS; HOT-CARRIER EFFECTS; SUBMICROMETER CMOS; TWIN-TUB V CMOS;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0024121747     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.8795     Document Type: Article

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