Radiation Testing of Semiconductor Devices for Space Electronics

Proceedings of the IEEE

Volumn 76, Issue 11, 1988, Pages 1510-1526

  Pease, Ronald L ^a   Johnston, Allan H ^b   Azarewicz, Joseph L ^c  

^a MISSION RESEARCH CORPORATION   (United States)

^b BOEING COMPANY   (United States)

^c IRT Corporation ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; ELECTRONIC EQUIPMENT--SPACE APPLICATIONS;

RADIATION HARDNESS; RADIATION TESTING; SPACE ELECTRONICS; SPACE RADIATION ENVIRONMENT; SPACE RADIATION SIMULATION;

SEMICONDUCTOR DEVICES;

EID: 0024104348     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/5.90110     Document Type: Article

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