Fast contingency screening and evaluation for voltage security analysis

IEEE Transactions on Power Systems

Volumn 3, Issue 4, 1988, Pages 1582-1590

  Ejebe, G C ^a   Van Meeteran, H P ^a   Wollenberg, B F ^a  

^a Advanced ECAD Department   (United States)

Author keywords

adaptive reduction; contingency analysis; Security analysis; sparse vectors; voltage reactive power screening

Indexed keywords

MATHEMATICAL TECHNIQUES;

BUS VOLTAGES; FAST CONTINGENCY SCREENING; SUBNETWORK; VOLTAGE SECURITY ANALYSIS; VOLTAGE SECURITY ASSESSMENT;

ELECTRIC POWER SYSTEMS;

EID: 0024104307     PISSN: 08858950     EISSN: 15580679     Source Type: Journal    
DOI: 10.1109/59.192968     Document Type: Article

References (21)

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