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84948608944
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Review of Power Requirements for Satellite Remote Sensing Systems
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edited by M. S. El-Genk and M. D. Hoover (Institute for Space Nuclear Power Studies, University of New Mexico, Albuquerque, 1988), held in Albuquerque, NM, January 11-14
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S. A. Morain, “Review of Power Requirements for Satellite Remote Sensing Systems,” in Transactions of the 5th Symposium on Space Nuclear Power Systems, edited by M. S. El-Genk and M. D. Hoover (Institute for Space Nuclear Power Studies, University of New Mexico, Albuquerque, 1988), held in Albuquerque, NM, January 11-14, 1988, p. 55.
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Comparison of Direct Thrust Nuclear Engine, Nuclear Electric Engine, and a Chemical Engine for Future Space Systems
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J. H. Ramsthaler and T. K. Sulmeisters, “Comparison of Direct Thrust Nuclear Engine, Nuclear Electric Engine, and a Chemical Engine for Future Space Systems,” in Transactions of the 5th Symposium on Space Nuclear Power Systems, p. 19.
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Transactions of the 5th Symposium on Space Nuclear Power Systems
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Multimegawatt Space Reactor Instrumentation and Control Technology Development Program: Year-End Status/Progress Report
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January
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N. R. Ortiz and F. V. Thome, “Multimegawatt Space Reactor Instrumentation and Control Technology Development Program: Year-End Status/Progress Report,” Sandia National Laboratories internal report, January 1987.
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Sandia National Laboratories internal report
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J. A. Bernard, K. S. Kwok, P. T. Menadier, F. V. Thome, and F. J. Wyant, “Experimental Evaluation of the MIT-SNL Period-Generated Minimum Time Control Laws for the Rapid Adjustment of Reactor Power,” in Transactions of the 5th Symposium on Space Nuclear Power Systems
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J. A. Bernard, “Evaluation of ‘Period-Generated’ Control Laws for the Time-Optimal Control of Reactor Power,” IEEE Trans. Nuc. Sci. NS-35, 888 (1988); J. A. Bernard, K. S. Kwok, P. T. Menadier, F. V. Thome, and F. J. Wyant, “Experimental Evaluation of the MIT-SNL Period-Generated Minimum Time Control Laws for the Rapid Adjustment of Reactor Power,” in Transactions of the 5th Symposium on Space Nuclear Power Systems, p. 589.
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RSMASS: A Preliminary Reactor/Shield Mass Model for SDI Application
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August
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A. C. Marshall, “RSMASS: A Preliminary Reactor/Shield Mass Model for SDI Application,” SAND86-1020, August 1986.
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SAND86-1020
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Estimating Payload Internal Temperatures and Radiator Size for Multimegawatt Space Platforms
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D. Dobranich, “Estimating Payload Internal Temperatures and Radiator Size for Multimegawatt Space Platforms,” SAND87-1216, August 1987.
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SAND87-1216
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D. Dobranich, “The Effect of Maximum-Allowable Payload Temperature on the Mass of a Multimegawatt Space-Based Platform, SAND87-1449, August 1987.
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SAND87-1449
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Dobranich, D.1
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Semiconductor Device Characteristics at 260°C for Aircraft Engine Control Applications
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L. J. Palkuti, J. L. Prince, and A. S. Glista, “Semiconductor Device Characteristics at 260°C for Aircraft Engine Control Applications,” IEEE Trans. Comp. Hybr. Manu. Technol. CHMT-2, 405 (1979).
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J. L. Prince, B. L. Draper, E. A. Rapp, J. N. Kronberg, and L. T. Fitch, “Performance of Digital Integrated Circuit Technologies at Very High Temperatures,” IEEE Trans. Comp. Hybr. Manu. Technol. CHMT-3, 571 (1980).
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“350°C CMOS Logic Process,” IEDM-81, 350 ( 1981 ). 15. D. W. Palmer, B. L. Draper, and G. A. Carlson, “Extreme Radiation Tolerance of High Temperature Solid-State Microelectronics,” IEEE Trans. Comp. Hybr. Manu. Technol. CHMT-4, 466 (1981).
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J. D. Beasom, R. D. Moore, G. Mohammed, and B. L. Draper, “350°C CMOS Logic Process,” IEDM-81, 350 ( 1981 ). 15. D. W. Palmer, B. L. Draper, and G. A. Carlson, “Extreme Radiation Tolerance of High Temperature Solid-State Microelectronics,” IEEE Trans. Comp. Hybr. Manu. Technol. CHMT-4, 466 (1981).
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Process Characteristics and Design Methods for a 300°C Quad Operational Amplifier
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F. Shoucair, W. Hwang, and P. Jain, “Electrical Characteristics of Large Scale Integration (LSI) MOSFETs at Very High Temperatures,” Microelectron. Reliability 24, 465 (Part I: Theory), and 24, 487 (Part II: Experiment), (1984).
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F. Shoucair, W. Hwang, and P. Jain, “Electrical Characteristics of Large Scale Integration (LSI) MOSFETs at Very High Temperatures, Part III: Modeling and Circuit Behavior,” IEEE Trans. Comp. Hybr. Manu. Technol. CHMT-7, 146 (1984).
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Some of the work discussed in this section has been described previously in:, “Silicon-on-Insulator Electronics for a Space Nuclear Power System,” accepted for publication in Proceedings of the 5th Symposium on Space Nuclear Power Systems, held in Albuquerque, NM, January IT-14, 1988, volume edited by M. S. El-Genk and M. D. Hoover, Orbit Book Co., Malabar, FL
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Some of the work discussed in this section has been described previously in: D. M. Fleetwood and S. S. Tsao, “Silicon-on-Insulator Electronics for a Space Nuclear Power System,” accepted for publication in Proceedings of the 5th Symposium on Space Nuclear Power Systems, held in Albuquerque, NM, January IT-14, 1988, volume edited by M. S. El-Genk and M. D. Hoover, Orbit Book Co., Malabar, FL, 1989.
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S. S. Tsao, D. M. Fleetwood, H. T. Weaver, L. Pfeiffer, and G. K. Celler, “Radiation-Tolerant, Sidewall-Hardened SOI/MOS Transistors,” IEEE Trans. Nuc. Sci. NS-34, 1686 (1987).
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In fact, functionality of ring oscillators on SOI at temperatures up to 500°C is reported in held in Albuquerque, NM, April 12-14
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In fact, functionality of ring oscillators on SOI at temperatures up to 500°C is reported in: J. McKitterick, “Silicon-on-Insulator for 300°C CMOS Application,” presented at the Workshop on High Temperature Electronics, held in Albuquerque, NM, April 12-14, 1988.
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(1988)
presented at the Workshop on High Temperature Electronics
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McKitterick, J.1
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and references contained therein
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See, for example, J. T. Schott and W. M. Shedd, “Silicon-on-Insulator Technologies,--Are We Converging on a Technique of Choice?” IEEE Trans. Nuc. Sci. NS-33, 1366 (1986), and references contained therein.
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The Effect of Elevated Temperature on Irradiated Metal-Oxide-Semiconductor (MOS) Devices
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Some of the work discussed in this section has been described previously in: held in Albuquerque, NM, January 12-16, 1987, volume edited by M. S. El-Genk and M. D. Hoover, Orbit Book Co., Malabar, FL
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Some of the work discussed in this section has been described previously in: D. M. Fleetwood and P. V. Dressendorfer, “The Effect of Elevated Temperature on Irradiated Metal-Oxide-Semiconductor (MOS) Devices,” accepted for publication in Proceedings of the 4th Symposium on Space Nuclear Power Systems, held in Albuquerque, NM, January 12-16, 1987, volume edited by M. S. El-Genk and M. D. Hoover, Orbit Book Co., Malabar, FL, 1988.
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(1988)
accepted for publication in Proceedings of the 4th Symposium on Space Nuclear Power Systems
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28. P. S. Winokur, J. R. Schwank, P. J. McWhorter, P. V. Dressendorfer, and D. C. Turpin, “Correlating the Radiation Response of MOS Capacitors and Transistors,” IEEE Trans. Nuc. Sci. NS-31, 1453 (1984).
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J. R. Schwank, P. S. Winokur, P. J. McWhorter, F. W. Sexton, P. V. Dressendorfer, and D. C. Turpin, “Physical Mechanisms Contributing to Device Rebound,” IEEE Trans. Nuc. Sci. NS-31, 1434 (1984). 28. P. S. Winokur, J. R. Schwank, P. J. McWhorter, P. V. Dressendorfer, and D. C. Turpin, “Correlating the Radiation Response of MOS Capacitors and Transistors,” IEEE Trans. Nuc. Sci. NS-31, 1453 (1984).
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P. S. Winokur, E. B. Errett, D. M. Fleetwood, P. V. Dressendorfer, and D. C. Turpin, “Optimizing and Controlling the Radiation Hardness of a Si-Gate CMOS Process,” IEEE Trans. Nuc. Sci. NS-32, 3954 (1985).
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P. S. Winokur, F. W. Sexton, J. R. Schwank, D. M. Fleetwood, P. V. Dressendorfer, T. F. Wrobel, and D. C. Turpin, “Total-Dose Radiation and Annealing Studies: Implications for Hardness Assurance,” IEEE Trans. Nuc. Sci. NS-33, 1343 (1986).
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P. S. Winokur, F. W. Sexton, G. L. Hash, and D. C. Turpin, “Total-Dose Failure Mechanisms of Integrated Circuits in Laboratory and Space Environments,” IEEE Trans. Nuc. Sci. NS-34, 1448 (1987).
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D. M. Fleetwood, P. S. Winokur, R. W. Beegle, P. V. Dressendorfer, and B. L. Draper, “Accounting for Dose Enhancement Effects with CMOS Transistors,” IEEE Trans. Nuc. Sci. NS-32, 4369 (1985).
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W. Wheelis and S. Luker, “The Response of a Power MOSFET (N-channel) and a Dielectric Isolated Operational Amplifier to the Combined Environmental Effects of High Temperature and Total Dose Gamma Radiation,” accepted for publication in Proceedings of the 4th Symposium on Space Nuclear Power Systems.
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accepted for publication in Proceedings of the 4th Symposium on Space Nuclear Power Systems.
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presentated at the 1988 IEEE Conference on Nuclear and Space Radiation Effects
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and references therein
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See, for example, R. H. Maurer and J. J. Suter, “Total-Dose Hardness Assurance for Low Earth Orbit,” IEEE Trans. Nuc. Sci. NS-34, 1757 (1987), and references therein.
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IEEE Trans. Nuc. Sci.
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Transient Radiation Effects in SOI Memories
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G. E. Davis, L. R. Hite, T. G. W. Blake, C.-E. Chen, H. W. Lam, and R. DeMoyer, Jr., “Transient Radiation Effects in SOI Memories,” IEEE Trans. Nuc. Sci. NS-32, 4432 (1985).
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Radiation-Hardened JFET Devices and CMOS Circuits Fabricated in SOI Films
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B.-Y. Tsaur, V. J. Sferrino, H. K. Choi, C. K. Chen, R. W. Mountain, J. T. Schott, W. M. Shedd, D. C. LaPierre, and R. Blanchard, “Radiation-Hardened JFET Devices and CMOS Circuits Fabricated in SOI Films,” IEEE Trans. Nuc. Sci. NS-33, 1372 (1986).
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IEEE Trans. Nuc. Sci.
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Hole Transport and Trapping in Field Oxides
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Using a 10-keV X-ray Source for Hardness Assurance
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D. M. Fleetwood, R. W. Beegle, F. W. Sexton, P. S. Winokur, S. L. Miller, R. K. Treece, J. R. Schwank, R. V. Jones, and P. J. McWhorter, “Using a 10-keV X-ray Source for Hardness Assurance,” IEEE Trans. Nuc. Sci. NS-33, 1330 (1986).
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46
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Postirradiation Effects in Field Oxide Isolation Structures
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Total-Dose Radiation Bias Effects in Laser-Recrystallized SOI MOSFETs
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B.-Y. Tsaur, R. W. Mountain, C. K. Chen, G. W. Turner, and J. C. C. Fan, “Effects of Ionizing Radiation on SOI/CMOS Devices Fabricated in Zone-Melt-Recrystallized Si Films on SiO 2,” IEEE Electron Dev. Lett. EDL-5, 238 (1984).
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50
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84948591977
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Developing a Total-Dose Radiation Screen for Silicon-on-Insulator MOS Transistors
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held in Atlanta, GA, May 15-20
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D. M. Fleetwood, S. S. Tsao, and P. S. Winokur, “Developing a Total-Dose Radiation Screen for Silicon-on-Insulator MOS Transistors,” presented at the May Meeting of the Electrochemical Society, held in Atlanta, GA, May 15-20, 1988.
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Fleetwood, D.M.1
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51
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Evaluating the Response of Silicon-on-Insulator Transistors to Cobalt-60 and 10-keV X-ray Irradiation
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Dec.
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D. M. Fleetwood, S. S. Tsao, and P. S. Winokur, “Evaluating the Response of Silicon-on-Insulator Transistors to Cobalt-60 and 10-keV X-ray Irradiation,” submitted for publication in IEEE Trans. Nuc. Sci. NS-35, Dec. (1988).
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Fleetwood, D.M.1
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The Properties of SOS Substrates, Devices, and IC’s
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1/f Noise and Grain-Boundary Diffusion in Aluminum and Aluminum Alloys
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Amorphous Metallizations for High-Temperature Semiconductor Device Applications
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Transient Radiation Simulations of CMOS Memory Circuits
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Factors Contributing to CMOS Static RAM Upset
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IEDM Technical Digest
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IEDM Technical Digest
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Reliable Tungsten Encapsulated Al:Si Interconnects for Submicron Multilevel Interconnection
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H. Yamamoto, S. Fujii, T. Kakiuchi, K. Yano, and T. Fujita, “Reliable Tungsten Encapsulated Al:Si Interconnects for Submicron Multilevel Interconnection,” IEDM Technical Digest, 205 (1987).
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IEDM Technical Digest
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Submicron Wiring Technology with Tungsten and Planarization
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IC Applications and Behavior of Tungsten in Elevated Temperature Regimes
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Stress in Sputtered TaSi Films on Polycrystalline Silicon
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High Temperature Stable W/GaAs Interface and Application to MESFETs and Digital Circuits
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held in San Juan Bautista, CA, May 11-14
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J. Y. Josefowicz and D. B. Rensch, “High Temperature Stable W/GaAs Interface and Application to MESFETs and Digital Circuits,” presented at the Workshop on Silicides and Metals for VLSI Applications, held in San Juan Bautista, CA, May 11-14, 1987.
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MOS-Transistor Radiation Response and X-Ray Dose Enhancement Effects
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Characterization of CMOS/SIMOX SRAMs at High Temperatures
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W. Krull and J. Lee, “Characterization of CMOS/SIMOX SRAMs at High Temperatures,” reported at the High Temperature Electronics Workshop, held in Albuquerque, NM, April 12-14, 1988.
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Lynn, D.K.1
McCormick, J.B.2
MacRoberts, M.D.J.3
Wilde, D.K.4
Dooley, G.R.5
Brown, D.R.6
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