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W. Strasz and M. A. Styblinski, “A second derivative Monte Carlo optimization of the production yield”, in Proc. ECCTD '80 (Warsaw, Poland), Sept. 1980, vol. 2, pp. 121-131.
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M. A. Styblinski, J. Ogrodzki, L. J. Opalski, and W. Strasz, “New methods of yield estimation and optimization and their application to practical problems”, in Proc. ISCAS-81 (Chicago), 1981.
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M. A. Styblinski and A. Ruszczynski, “Stochastic approximation approach to production yield optimization”, in Proc. 25th Midwest Symp. Circuits Syst. (Houghton, MI), Aug. 30-31, 1981.
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M. A. Styblinski and L. J. Opalski, “A random perturbation method for IC yield optimization with deterministic process parameters”, in Proc. Int. Symp. Circuits Syst. (Montreal, Canada), May 7-10, 1984, pp. 977-980.
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M. A. Styblinski, “Yield gradient estimation of truncated density functions and related topics”, in Proc. 1985 IEEE Int. Symp. Circuits Syst. (Kyoto, Japan), June 1985.
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M. A. Styblinski, “Problems of yield gradient estimation for truncated probability density functions”, IEEE Trans. Computer-Aided Design, vol. CAD-5, pp. 30-38, Jan. 1986.
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L. J. Opalski and M. A. Styblinski, “A user-reprogrammable interactive interface system for computer-aided stochastic optimization of IC's”, in Proc. 27th Midwest Symp. Circuits Syst. (Morgantown, WV), June 1984, pp. 587-590.
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Convergence of a class of random search algorithms
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V. Ya. Katkovnik, and O. Yu. Kulichitskii, “Convergence of a class of random search algorithms”, Automat. Remote Contr., no. 8, pp. 321-1326, 1972 (translated from Russian).
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