Circuits for Pseudoexhaustive Test Pattern Generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 7, Issue 10, 1988, Pages 1068-1080

  Wang, Laung Terng ^a   Mccluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS -- COMPUTER AIDED DESIGN;

CYCLIC CODES; LINEAR FEEDBACK SHIFT REGISTERS; PSEUDOEXHAUSTIVE TEST PATTERN GENERATORS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0024090224     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.7806     Document Type: Article

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