Use of LEED Intensity Oscillations in Monitoring Thin Film Growth

Langmuir

Volumn 4, Issue 5, 1988, Pages 1096-1100

  Flynn, D K ^a   Wang, W ^a   Chang, S L ^a   Tringides, M C ^a   Thiel, P A ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS--GROWING; FILMS--PREPARATION; METALLOGRAPHY--ORDER-DISORDER; PLATINUM AND ALLOYS--THIN FILMS; PLATINUM PALLADIUM ALLOYS--BIMETALS;

BIMETALLIC CATALYSTS; INTENSITY OSCILLATIONS; LOW ENERGY ELECTRON DIFFRACTION; METAL-ON-METAL GROWTH; PERIODIC OSCILLATIONS; REAL SPACE VECTORS;

CATALYSTS;

EID: 0024072015     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la00083a005     Document Type: Article

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