Estimation of Surface Roughness Parameters from Dual-Frequency Measurements of Radar Backscattering Coefficients

IEEE Transactions on Geoscience and Remote Sensing

Volumn 26, Issue 5, 1988, Pages 574-579

  Mo, Tsan ^a   Wang, James R ^b   Schmugge, Thomas J ^c  

^a Computer Sciences Corporation ^*  (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENTS; MICROWAVES -- SCATTERING; SOILS -- REMOTE SENSING; SURFACES -- ROUGHNESS MEASUREMENT;

BESSEL FUNCTIONS; GEOMETRICAL OPTICS MODEL; KIRCHHOFF APPROXIMATION; RADAR BACKSCATTERING COEFFICIENTS; SURFACE ROUGHNESS PARAMETERS;

RADAR;

EID: 0024070175     PISSN: 01962892     EISSN: 15580644     Source Type: Journal    
DOI: 10.1109/36.7682     Document Type: Article

References (14)

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