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Solid State Electronics

Volumn 31, Issue 8, 1988, Pages 1277-1288

Dielectric spectroscopy of silicon barrier devices

(2) Jonscher, Andrew K a Robinson, Mark N a

a UNIVERSITY OF LONDON (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES - DIELECTRIC PROPERTIES;

DIELECTRIC SPECTROSCOPY; ELECTROCHEMICAL INTERACTION; LOSS PEAK; SCHOTTKY DIODE; SILICON BARRIER DEVICES; SURFACE BARRIER DIODE;

SEMICONDUCTOR DEVICES, SCHOTTKY BARRIER;

EID: 0024066045 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1101(88)90427-3 Document Type: Article

Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.