Performance Limits of Mixed Analog/Digital Circuits With Scaled Mosfet'S

IEEE Journal of Solid-State Circuits

Volumn 23, Issue 4, 1988, Pages 942-949

  Sano, Eiichi ^a   Tsukahara, Tsuneo ^a   Iwata, Atsushi ^a  

^a LSI Laboratories N'IT Corporation ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL, ELECTRIC VARIABLES -- VOLTAGE; ELECTRIC FIELDS; SEMICONDUCTOR DEVICES, MOSFET -- PERFORMANCE;

CONSTANT ELECTRIC FIELD (CE); CONSTANT VOLTAGE (CV) SCALING LAWS; MIXED ANALOG/DIGITAL CIRCUITS; QUASICONSTANT VOLTAGE (QCV); SCALED MOSFETS;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0024056632     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.345     Document Type: Article

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