Nonlocality of the Electron Ionization Coefficient in n-MOSFET's: An Analytic Approach

IEEE Electron Device Letters

Volumn 9, Issue 8, 1988, Pages 399-401

  Higman, J M ^a   Kizilyalli, I C ^a   Hess, Karl ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; MATHEMATICAL STATISTICS -- MONTE CARLO METHODS;

DRIFT-DIFFUSION DEVICE SIMULATORS; ELECTRON IONIZATION COEFFICIENT NONLOCALITY; N-MOSFET; SPATIALLY VARYING ELECTRIC FIELD;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0024055360     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.757     Document Type: Article

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