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Volumn 110, Issue 3, 1988, Pages 266-273

Elasto-plastic analysis of the peel test for thin film adhesion

Author keywords

[No Author keywords available]

Indexed keywords

ELASTOPLASTICITY; FRACTURE MECHANICS; MATERIALS TESTING;

EID: 0024048091     PISSN: 00944289     EISSN: 15288889     Source Type: Journal    
DOI: 10.1115/1.3226047     Document Type: Article
Times cited : (172)

References (23)
  • 5
    • 85024651923 scopus 로고
    • 10.05, Electronics (II), ASTM
    • Annual Book of ASTM Standard, Vol. 10.05, Electronics (II), ASTM, 1983.
    • (1983)
  • 11
    • 85024645436 scopus 로고    scopus 로고
    • University of Illinois, TAM Technical Report No. 472, IBM Test No. 441614
    • Kim, K. S., University of Illinois, TAM Technical Report No. 472, IBM Test No. 441614.
    • Kim, K.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.