Smectic c*chevron layer structure studied by x-ray diffraction

Japanese Journal of Applied Physics

Volumn 27, Issue 5A, 1988, Pages L725-L728

  Ouchi, Yukio ^a   Lee, Ji ^a   Takezoe, Hideo ^a   Fukuda, Atsuo ^a   Kondo, Katsumi ^a,b   Kitamura, Teruo ^a,b   Mukoh, Akio ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

Chiral smectic C; Ferroelectric liquid crystal; Layer structure; SiO oblique evaporation; X ray diffraction

Indexed keywords

FERROELECTRIC MATERIALS - STRUCTURE; SILICON COMPOUNDS - APPLICATIONS; X-RAYS - DIFFRACTION;

CHEVRON LAYER STRUCTURE; CHIRAL SMECTIC PHASES; FERROELECTRIC LIQUID CRYSTAL; OBLIQUE EVAPORATION; SILICON OXIDE;

CRYSTALS, LIQUID;

EID: 0024016337     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.27.L725     Document Type: Article

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