Nondestructive Depth Profiling of Rare-Earth and Actinide Zeolites via Rutherford Backscattering Methods

Analytical Chemistry

Volumn 60, Issue 10, 1988, Pages 1046-1051

  Baumann, Scott A ^a   Strathman, Michael D ^a   Suib, Steven L ^b  

^a CHARLES EVANS AND ASSOCIATES   (United States)

^b UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATALYSTS - MATERIALS; SPECTROSCOPY, ELECTRON - APPLICATIONS; SPECTROSCOPY, X-RAY - APPLICATIONS;

ACTINIDE ZEOLITES; NONDESTRUCTIVE DEPTH PROFILING; OXYGEN SURFACE RATIO; RUTHERFORD BACKSCATTERING METHODS; ZEOLITE CATALYSTS;

ZEOLITES;

EID: 0024013573     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00161a019     Document Type: Article

References (22)

1. Barr, T. L. In Practical Surface Analysis; Briggs, D., Seah, M. P., Eds.; Wiley: New York, 1983; Chapter 8, Pp 282–358.
2. Madey, T. E.; Wagner, C. D.; Joshi, A. J. Electron Spectrosc. Relat. Phenom. 1985. 281. 757.
3. Barr, T. L.; Lishka, M. A. J. Am. Chem. Soc. 1985, 108, 3178–3186.
4. Corma, A.; Fornes, V.; Pallota, 0.; Cruz, J. M.; Ayerbe, A. J. Chem. Soc., Chem. Commun. 1986. 333–334.
5. Ward. M. B.; Lunsford, J. H. J. Catal. 1984. 524–527.
6. Meyers, B. L.; Fleisch, T. M.; Marshall, C. L.; Hall, J. B. Proceedings of the North American Catalyst Society Meeting, Houston, TX, 1985; B15.
7. Andera, V.; Kubelkova, L.; Novakova, J.; Wichterlova, B.; Bednarova, S. Zeolites 1985, 5, 67–69.
8. Suib, S. L.; Winiecki, A. M.; Kostapapas, A. Langmuir 1987, 3, 483–488.
9. West, R. M.; Castle. J. E. SIA, Surf. Interface Anal. 1982. 4. 68–75.
10. Castle, J. E.; Hazell, L. B.; West, R. M. J. Electron Spectrosc. Relat. Phenom. 1979, 16, 97–106.
11. Barr, T. L. Am. Lab. (Fairfield, Conn.) 1978 (Nov). 65–76.
12. Barr, T. L. Appl. Surf. Sci. 1983.,15, 1–35.
13. Turner, N. H.; Dunlap, B. I.; Colton, R. J. Anal. Chem. 1984, 56, 373R-416R.
14. Baumann, S.; Strathman, M. D.; Suib, S. L. J. Chem. Soc., Chem. Commun. 1986, 308–309.
15. Carrado, K. A.; Suib, S. L.; Skoularikis, N. D.; Coughlin, R. W. Inorg. Chem. 1986, 25. 4217–4221.
16. Evans, C. A., Jr.; Blattner, R. J. Annu. Rev. Mater. Sci. 1978, 8, 181, and references therein.
17. Chu, W. K.; Mayer, J. W.; Nicolet, M. A. Backscattering Spectrometry; Academic: New York, 1978; pp 26–30.
18. Evans, C. A.; Strathman, M. D. Ind. Res. Dev. 1983, 25, (Dec) 99–101.
19. Suib, S. L.; Coughlin, D. F.; Otter, F. A.; Conopask, L. F. J. Catal. 1983. 84. 410–422.
20. Suib, S. L.; Zerger, R. P.; Stucky, G. D.; Emberson, R. M.; Debrunner, P. G.; Iton, L. E. Inorg. Chem. 1980, 19, 1858, 1962.
21. Suib, S. L.; Zerger, R. P.; Stucky, G. D.; Morrison, T. I.; Shenoy, G. R. J. Chem. Phys. 1984, 80, 2203–2207.
22. Stucky, G. D.; Iton, L. E.; Morrison, T. I.; Shenoy, G. R.; Suib, S. L.; Zerger, R. P. J. Mol. Catal. 1984, 27, 71–80.