Hall-effect measurement on polycrystalline Sno2thin films

Japanese Journal of Applied Physics

Volumn 27, Issue 4R, 1988, Pages 552-555

  Fujisawa, Akira ^a   Nishino, Taneo ^a   Hamakawa, Yoshihiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Hall effect measurement; Sno2thin film

Indexed keywords

HALL EFFECT - MEASUREMENTS; SEMICONDUCTOR MATERIALS - CHARGE CARRIERS;

CARRIER CONCENTRATION; FERMI LEVEL;

TIN COMPOUNDS;

EID: 0023996702     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.27.552     Document Type: Article

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