Application of Taguchi methods to surface mount processes

Quality and Reliability Engineering International

Volumn 4, Issue 2, 1988, Pages 171-181

  Bandurek, G R ^a   Disney, J ^b,c   Bendell, A ^b,c  

^a Mars Electronics ^*  (United Kingdom)

^b NOTTINGHAM TRENT UNIVERSITY   (United Kingdom)

^c Services Ltd ^*  (United Kingdom)

Author keywords

Analysis of variance; ANOVA; Experimental design; Off line quality control; Quality design; Surface mount technology; Taguchi methods

Indexed keywords

PROCESS CONTROL - OPTIMIZATION; STATISTICAL METHODS;

EXPERIMENTAL DESIGN; TAGUCHI METHODS; VARIANCE ANALYSIS;

ELECTRONICS PACKAGING;

EID: 0023995881     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.4680040212     Document Type: Article

References (6)