CHARACTERIZATION BY 51V SOLID-STATE NMR, LASER RAMAN, AND X-RAY PHOTOELECTRON SPECTROSCOPY OF VANADIUM SPECIES DEPOSITED ON gamma -Al2O3.

Journal of physical chemistry

Volumn 92, Issue 5, 1988, Pages 1230-1235

  Le Coustumer, L R ^a   Taouk, B ^a   Le Meur, M ^a   Payen, E ^a   Guelton, M ^a   Grimblot, J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA - SURFACES; CATALYSTS - MATERIALS; NUCLEAR MAGNETIC RESONANCE; SPECTROSCOPY, RAMAN - APPLICATIONS; SPECTROSCOPY, X-RAY - APPLICATIONS;

IMPREGNATING SOLUTION; OXOVANADATE; OXOVANADIUM; X-RAY PHOTOELECTRON SPECTROSCOPY;

VANADIUM COMPOUNDS;

EID: 0023984180     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/j100316a044     Document Type: Article

References (28)