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Volumn 36, Issue 2, 1988, Pages 202-215
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EMPIRICAL EVALUATION OF A QUEUEING NETWORK MODEL FOR SEMICONDUCTOR WAFER FABRICATION.
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Author keywords
[No Author keywords available]
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Indexed keywords
PROBABILITY - QUEUEING THEORY;
PRODUCTION CONTROL - INVENTORY CONTROL;
SYSTEMS ENGINEERING;
NETWORK MODELS;
PERFORMANCE MEASURES;
WAFER FABRICATION;
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 0023981636
PISSN: 0030364X
EISSN: None
Source Type: Journal
DOI: 10.1287/opre.36.2.202 Document Type: Article |
Times cited : (122)
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References (0)
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