The Application of Scanning Tunneling Microscopy to in Situ Studies of Nickel Electrodes under Potential Control

Journal of the Electrochemical Society

Volumn 135, Issue 3, 1988, Pages 783-784

  Lev, Ovadia ^a   Fan, Fu Ren ^a   Bard, Allen J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; SURFACES - STRUCTURE;

FARADAIC CURRENT; NEGATIVE POLARIZATION; PASSIVATING OXIDE; TUNNELING CURRENT;

ELECTRODES;

EID: 0023977859     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/1.2095751     Document Type: Article

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15. The support of the Robert A. Welch Foundation and the Texas Advanced Technology Research Program is gratefully acknowledged. We thank the US-Israel Education Foundation for providing a Fulbright Fellowship to 0. Lev.