Fast-Scan Cyclic Voltammetry as a Method to Measure Rapid, Heterogeneous Electron-Transfer Kinetics

Analytical Chemistry

Volumn 60, Issue 4, 1988, Pages 306-310

  Wipf, David O ^a   Kristensen, Eric W ^a   Deakin, Mark R ^a   Wightman, R Mark ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; RUTHENIUM COMPOUNDS - REDUCTION;

ACETONITRILE; FAST-SCAN CYCLIC VOLTAMMETRY; FERROCENE; HETEROGENEOUS ELECTRON-TRANSFER KINETICS; ULTRAMICROELECTRODES;

ELECTROCHEMISTRY;

EID: 0023964871     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00155a006     Document Type: Article

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