Picosecond Optical Sampling of GaAs Integrated Circuits

IEEE Journal of Quantum Electronics

Volumn 24, Issue 2, 1988, Pages 198-220

  Weingarten, Kurt J ^a   Rodwell, Mark J W ^a   Bloom, David M ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WAVEFORMS - MEASUREMENTS; ELECTROOPTICAL DEVICES; ELECTROOPTICAL EFFECTS; MICROSTRIP DEVICES - TESTING; MICROWAVE DEVICES - TESTING;

DIRECT ELECTROOPTIC SAMPLING; GALLIUM ARSENIDE INTEGRATED CIRCUITS; NONCONTACT OPTICAL-PROBING TECHNIQUE; PICOSECOND OPTICAL SAMPLING; PICOSECOND TIME RESOLUTION;

INTEGRATED CIRCUIT TESTING;

EID: 0023961844     PISSN: 00189197     EISSN: 15581713     Source Type: Journal    
DOI: 10.1109/3.115     Document Type: Article

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