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Volumn 7, Issue 1, 1988, Pages 75-83

Bounds and Analysis of Aliasing Errors in Linear Feedback Shift Registers

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; MATHEMATICAL TECHNIQUES - ERROR ANALYSIS; MATHEMATICAL TRANSFORMATIONS - Z TRANSFORMS; PROBABILITY;

EID: 0023869357     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.3132     Document Type: Article
Times cited : (67)

References (16)
  • 1
    • 0018051861 scopus 로고
    • Feedback shift register testing
    • (Toulouse, France), June
    • R. David, “Feedback shift register testing”, in Proc. FTCS 8, (Toulouse, France), pp. 103-107, June 1978.
    • (1978) Proc. FTCS 8 , pp. 103-107
    • David, R.1
  • 2
    • 0019029545 scopus 로고
    • Measures of the effectiveness of fault signature analysis
    • June
    • J. E. Smith, “Measures of the effectiveness of fault signature analysis”, I.E.E.E. T.C., pp. 510-514, June 1980.
    • (1980) I.E.E.E. T.C. , pp. 510-514
    • Smith, J.E.1
  • 4
    • 0021172698 scopus 로고
    • Signature analysis of multioutput circuits
    • (Orlando, FL), June
    • R. David, “Signature analysis of multioutput circuits”, in Proc. FTCS 14, (Orlando, FL) pp. 366-371, June 1984.
    • (1984) Proc. FTCS 14 , pp. 366-371
    • David, R.1
  • 6
    • 0022917185 scopus 로고
    • Comparison of aliasing errors for primitive and nonprimitive polynomials
    • Sepot.
    • T. W. Williams, W. Daehn, M. Gruetzner, and C. W. Starke, “Comparison of aliasing errors for primitive and nonprimitive polynomials”, in Proc. Int. Test Conf, pp. 282-288, Sepot. 1986.
    • (1986) Proc. Int. Test Conf , pp. 282-288
    • Williams, T.W.1    Daehn, W.2    Gruetzner, M.3    Starke, C.W.4
  • 8
    • 0002553777 scopus 로고
    • Signature analysis: A new digital field services method
    • May
    • R. A. Frohwerk, “Signature analysis: A new digital field services method”, Hewlett-Packard J., pp. 2-8, May 1977.
    • (1977) Hewlett-Packard J. , pp. 2-8
    • Frohwerk, R.A.1
  • 9
    • 84909832629 scopus 로고
    • Check sum test methods
    • Pittsburgh, PA, June
    • J. P. Hayes, “Check sum test methods”, in Proc. FTCS 6, Pittsburgh, PA, pp. 114-119, June 1976.
    • (1976) Proc. FTCS 6 , pp. 114-119
    • Hayes, J.P.1
  • 10
    • 0019029565 scopus 로고
    • Syndrome-testable design of combinational circuits
    • June
    • J. Savir, “Syndrome-testable design of combinational circuits”, I.E.E.E. Trans. Computers, pp. 442-451, June 1980.
    • (1980) I.E.E.E. Trans. Computers , pp. 442-451
    • Savir, J.1
  • 11
    • 0019677187 scopus 로고
    • Testing by verifying Walsh coefficients
    • June
    • A. K. Suskind, “Testing by verifying Walsh coefficients”, in Proc. FTCS-11, pp. 206-208, June 1981.
    • (1981) Proc. FTCS-11 , pp. 206-208
    • Suskind, A.K.1
  • 12
    • 0019038841 scopus 로고
    • Testing by feedback shift register
    • July
    • R. David, “Testing by feedback shift register”, I.E.E.E. Trans. Computers, pp. 669-673, July 1980.
    • (1980) I.E.E.E. Trans. Computers , pp. 669-673
    • David, R.1
  • 13
    • 0348084766 scopus 로고
    • Compact testing: Testing with compressed data
    • Pittsburgh, June
    • K. P. Parker, “Compact testing: Testing with compressed data”, in Proc. FTCS 6, Pittsburgh, pp. 93-98, June 1976.
    • (1976) Proc. FTCS 6 , pp. 93-98
    • Parker, K.P.1
  • 14
    • 84909862122 scopus 로고
    • The ubiquitous parity bit
    • Portland, June
    • W. C. Carter, “The ubiquitous parity bit”, in Proc. FTCS 12, Portland, June 1982.
    • (1982) Proc. FTCS 12
    • Carter, W.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.