-
1
-
-
0018051861
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Feedback shift register testing
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(Toulouse, France), June
-
R. David, “Feedback shift register testing”, in Proc. FTCS 8, (Toulouse, France), pp. 103-107, June 1978.
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(1978)
Proc. FTCS 8
, pp. 103-107
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-
David, R.1
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2
-
-
0019029545
-
Measures of the effectiveness of fault signature analysis
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June
-
J. E. Smith, “Measures of the effectiveness of fault signature analysis”, I.E.E.E. T.C., pp. 510-514, June 1980.
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(1980)
I.E.E.E. T.C.
, pp. 510-514
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-
Smith, J.E.1
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4
-
-
0021172698
-
Signature analysis of multioutput circuits
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(Orlando, FL), June
-
R. David, “Signature analysis of multioutput circuits”, in Proc. FTCS 14, (Orlando, FL) pp. 366-371, June 1984.
-
(1984)
Proc. FTCS 14
, pp. 366-371
-
-
David, R.1
-
6
-
-
0022917185
-
Comparison of aliasing errors for primitive and nonprimitive polynomials
-
Sepot.
-
T. W. Williams, W. Daehn, M. Gruetzner, and C. W. Starke, “Comparison of aliasing errors for primitive and nonprimitive polynomials”, in Proc. Int. Test Conf, pp. 282-288, Sepot. 1986.
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(1986)
Proc. Int. Test Conf
, pp. 282-288
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-
Williams, T.W.1
Daehn, W.2
Gruetzner, M.3
Starke, C.W.4
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8
-
-
0002553777
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Signature analysis: A new digital field services method
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May
-
R. A. Frohwerk, “Signature analysis: A new digital field services method”, Hewlett-Packard J., pp. 2-8, May 1977.
-
(1977)
Hewlett-Packard J.
, pp. 2-8
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-
Frohwerk, R.A.1
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9
-
-
84909832629
-
Check sum test methods
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Pittsburgh, PA, June
-
J. P. Hayes, “Check sum test methods”, in Proc. FTCS 6, Pittsburgh, PA, pp. 114-119, June 1976.
-
(1976)
Proc. FTCS 6
, pp. 114-119
-
-
Hayes, J.P.1
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10
-
-
0019029565
-
Syndrome-testable design of combinational circuits
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June
-
J. Savir, “Syndrome-testable design of combinational circuits”, I.E.E.E. Trans. Computers, pp. 442-451, June 1980.
-
(1980)
I.E.E.E. Trans. Computers
, pp. 442-451
-
-
Savir, J.1
-
11
-
-
0019677187
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Testing by verifying Walsh coefficients
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June
-
A. K. Suskind, “Testing by verifying Walsh coefficients”, in Proc. FTCS-11, pp. 206-208, June 1981.
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(1981)
Proc. FTCS-11
, pp. 206-208
-
-
Suskind, A.K.1
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12
-
-
0019038841
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Testing by feedback shift register
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July
-
R. David, “Testing by feedback shift register”, I.E.E.E. Trans. Computers, pp. 669-673, July 1980.
-
(1980)
I.E.E.E. Trans. Computers
, pp. 669-673
-
-
David, R.1
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13
-
-
0348084766
-
Compact testing: Testing with compressed data
-
Pittsburgh, June
-
K. P. Parker, “Compact testing: Testing with compressed data”, in Proc. FTCS 6, Pittsburgh, pp. 93-98, June 1976.
-
(1976)
Proc. FTCS 6
, pp. 93-98
-
-
Parker, K.P.1
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14
-
-
84909862122
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The ubiquitous parity bit
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Portland, June
-
W. C. Carter, “The ubiquitous parity bit”, in Proc. FTCS 12, Portland, June 1982.
-
(1982)
Proc. FTCS 12
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-
Carter, W.C.1
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15
-
-
0016507959
-
An Advanced Fault Isolation System for Digital Logic
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May
-
N. Benowitz, D. Calhoun, G. Alderson, J. Bauer and C. Joeckel, “An Advanced Fault Isolation System for Digital Logic”, I.E.E.E., May 1975, pp. 489-497.
-
(1975)
I.E.E.E.
, pp. 489-497
-
-
Benowitz, N.1
Calhoun, D.2
Alderson, G.3
Bauer, J.4
Joeckel, C.5
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