XPS study of non-bridging oxygens in Na2OSiO2 gels

Journal of Non-Crystalline Solids

Volumn 99, Issue 1, 1988, Pages 140-150

  Nasu, Hiroyuki ^a   Heo, Jong ^a   Mackenzie, John D ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GELS; OXYGEN; SPECTROSCOPY, X-RAY - APPLICATIONS;

NONBRIDGING OYXGEN; SODIUM-OXIDE-SILICA GELS; X-RAY PHOTOELECTRON SPECTROSCOPY; XPS;

SILICA GEL;

EID: 0023862074     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(88)90466-8     Document Type: Article

References (27)

1. XPS measurements and structural aspects of silicate and phosphate glasses
2. XPS Studies of Fluorozirconates
3. Bridging and Nonbridging Oxygen Atoms in Alkali Aluminosilicate Glasses
4. Sol-gel processing of silica
5. Coordination Number of Doped Boron Atoms in Photochemically-Deposited Amorphous Silicon Studied by X-Ray Photoelectron Spectroscopy