IMPACT OF AN EXTERNAL SODIUM DIFFUSION SOURCE ON THE RELIABILITY OF MOS CIRCUITRY.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1988, Pages 167-172

  Hefley, Patrick L ^a   McPherson, J W ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - FAILURE; SODIUM COMPOUNDS - DIFFUSION;

EXTERNAL SODIUM DIFFUSION SOURCE; FAILURE KINETICS; NONVOLATILE DEVICES; TIME-TO-FAILURE;

SEMICONDUCTOR DEVICES, MOS;

EID: 0023846815     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)