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Volumn 27, Issue 1R, 1988, Pages 62-67

The nature of nitrogen-oxygen complexes in silicon

Author keywords

Isothermal annealing; N Si; Nitrogen oxygen complex; Shallow donor

Indexed keywords

HEAT TREATMENT - ANNEALING; NITROGEN; OXYGEN; SPECTROSCOPY, ABSORPTION - APPLICATIONS;

EID: 0023846461     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.27.62     Document Type: Article
Times cited : (71)

References (9)
  • 7
    • 84956195149 scopus 로고
    • L. C. Kimerling and J. M. Parsey (The Metallurgical Society. AIME
    • H. J. Stein: Defects in Semiconductors, eds. L. C. Kimerling and J. M. Parsey (The Metallurgical Society. AIME, 1984) p. 893.
    • (1984) Defects in Semiconductors , pp. 893
    • Stein, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.