Structured Highlight Inspection of Specular Surfaces

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 10, Issue 1, 1988, Pages 44-55

  Sanderson, Arthur C ^a   Weiss, Lee E ^a   Nayar, Shree K ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Computer vision; inspection; robotics; shape measurement; solder joints; stereo vision

Indexed keywords

ROBOTICS - VISION SYSTEMS; VISION - ARTIFICIAL;

SPECULAR SURFACES; STEREO STRUCTURED HIGHLIGHT SYSTEM; STRUCTURED HIGHLIGHT INSPECTION SYSTEM (SHINY);

SURFACES;

EID: 0023831512     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.3866     Document Type: Article

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